Invention Grant
- Patent Title: Method of analyzing interconnect for global circuit wires
- Patent Title (中): 分析全球电路线互连的方法
-
Application No.: US13608012Application Date: 2012-09-10
-
Publication No.: US08799842B2Publication Date: 2014-08-05
- Inventor: Bogdan Tutuianu , George J. Chen
- Applicant: Bogdan Tutuianu , George J. Chen
- Applicant Address: US CA Redwood Shores
- Assignee: Oracle International Corporation
- Current Assignee: Oracle International Corporation
- Current Assignee Address: US CA Redwood Shores
- Agency: Kraguljac Law Group, LLC
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Systems, methods, and other embodiments associated with analyzing interconnects for global wires of a circuit are described. In one embodiment, for a target wire in a circuit design, a method includes determining an inductance value and a capacitance value for parallel wires to the target wire. The method then calculates a second capacitance value for non-parallel wires to the target wire and calculates an estimated inductance value for the non-parallel wires based on the second capacitance value. A circuit model for the target wire may then be generated using the inductance and capacitance values.
Public/Granted literature
- US20140075405A1 METHOD OF ANALYZING INTERCONNECT FOR GLOBAL CIRCUIT WIRES Public/Granted day:2014-03-13
Information query