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US08799831B2 Inline defect analysis for sampling and SPC 有权
抽样和SPC的在线缺陷分析

Inline defect analysis for sampling and SPC
Abstract:
In one embodiment, an inline defect analysis method includes receiving geometric characteristics of individual defects and design data corresponding to the individual defects, determining which of the individual defects are likely to be nuisance defects using the geometric characteristics and the corresponding design data, and refraining from sampling the defects that are likely to be nuisance defects.
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