Invention Grant
- Patent Title: Error correction in multiple semiconductor memory units
- Patent Title (中): 多个半导体存储单元中的纠错
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Application No.: US12259949Application Date: 2008-10-28
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Publication No.: US08799743B2Publication Date: 2014-08-05
- Inventor: David R. Resnick
- Applicant: David R. Resnick
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Various embodiments include apparatus and methods to store data in a first semiconductor memory unit and to store error correction information in a second semiconductor memory unit to recover the data. The error correction information has a value equal to at least the value of the data store in the first memory unit.
Public/Granted literature
- US20100107036A1 ERROR CORRECTION IN MULTIPLE SEMICONDUCTOR MEMORY UNITS Public/Granted day:2010-04-29
Information query
