Invention Grant
- Patent Title: Apparatus and method for measuring charge density distribution
- Patent Title (中): 用于测量电荷密度分布的装置和方法
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Application No.: US13163988Application Date: 2011-06-20
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Publication No.: US08798947B2Publication Date: 2014-08-05
- Inventor: Helen Prance , Robert John Prance , Philip Watson , Sam Thomas Beardsmore-Rust
- Applicant: Helen Prance , Robert John Prance , Philip Watson , Sam Thomas Beardsmore-Rust
- Applicant Address: GB Brighton
- Assignee: The University of Sussex-Falmer
- Current Assignee: The University of Sussex-Falmer
- Current Assignee Address: GB Brighton
- Agency: Locke Lord LLP
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
The invention provides a method and apparatus for the detection of charge density distribution at the surface of a material sample. The apparatus comprises an electric potential sensor for measuring surface charge on a material sample, wherein the electrical potential sensor includes a probe for capacitively coupling the electric potential sensor to the surface of the material sample, an amplifier for generating a measurement output, the probe being connected to an input of the amplifier and the measurement output being supplied at an output of the amplifier, and a feedback arrangement driven from the output of the amplifier for enhancing the input impedance of the amplifier. A positioning system mounts the probe of the electric potential sensor above the material sample and moves the probe at a constant height over a surface of the said sample, and a processing system receives and processes the measurement output of the electric potential sensor for generating a digital record of the charge density distribution at the surface of the material sample.
Public/Granted literature
- US20120323513A1 APPARATUS AND METHOD FOR MEASURING CHARGE DENSITY DISTRIBUTION Public/Granted day:2012-12-20
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