Invention Grant
- Patent Title: Computing device and method for testing charging and discharging reliability of rechargable battery
- Patent Title (中): 用于测试充电电池充放电可靠性的计算装置和方法
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Application No.: US13241272Application Date: 2011-09-23
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Publication No.: US08798945B2Publication Date: 2014-08-05
- Inventor: Shen-Chun Li , Hsien-Chuan Liang , Shou-Kuo Hsu
- Applicant: Shen-Chun Li , Hsien-Chuan Liang , Shou-Kuo Hsu
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW100101576A 20110117
- Main IPC: G01R31/36
- IPC: G01R31/36 ; H02J7/00

Abstract:
In a method for testing the charging and discharging reliability of a rechargeable battery, a test device measures the battery to obtain first terminal voltages and first electric currents when the battery is charged by a power supply. After the battery is discharged, the test device measures the battery to obtain second terminal voltages and second electronic currents. Based on the first terminal voltages and the first electric currents, a first lifecycle curve can be created. Based on the second terminal voltages and the second electric currents, a second lifecycle curve is created. The method compares the first lifecycle curve with a charging lifecycle curve, compares the second lifecycle curve with a discharging lifecycle curve, and generates a lifecycle estimation report of the rechargeable battery according to the comparison results.
Public/Granted literature
- US20120185189A1 COMPUTING DEVICE AND METHOD FOR TESTING CHARGING AND DISCHARGING RELIABILITY OF RECHARGABLE BATTERY Public/Granted day:2012-07-19
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