Invention Grant
- Patent Title: Diagnosis processing device, diagnosis processing system, diagnosis processing method, diagnosis processing program and computer-readable recording medium, and classification processing device
- Patent Title (中): 诊断处理装置,诊断处理系统,诊断处理方法,诊断处理程序和计算机可读记录介质以及分类处理装置
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Application No.: US13496391Application Date: 2010-08-16
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Publication No.: US08798345B2Publication Date: 2014-08-05
- Inventor: Takahiro Sasaki , Satoru Kishida , Kentaro Kinoshita
- Applicant: Takahiro Sasaki , Satoru Kishida , Kentaro Kinoshita
- Applicant Address: JP Osaka-shi, Osaka JP Tottori-shi, Tottori
- Assignee: Sharp Kabushiki Kaisha,National University Corporation Tottori University
- Current Assignee: Sharp Kabushiki Kaisha,National University Corporation Tottori University
- Current Assignee Address: JP Osaka-shi, Osaka JP Tottori-shi, Tottori
- Agency: Morrison & Foerster LLP
- Priority: JP2009-215843 20090917
- International Application: PCT/JP2010/063812 WO 20100816
- International Announcement: WO2011/033890 WO 20110324
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/62

Abstract:
A diagnosis processing device is provided in which diagnosis is realizable by a simple arrangement. A diagnosis processing device (1) of the present invention includes: a learning pattern creating section (10a) for creating a learning pattern by sampling data from a learning image in which abnormality information indicating a substantive feature of abnormality of a target is pre-known; a learning processing section (12) for causing a neural network (17) to learn, by using learning patterns; a diagnostic pattern creating section (10b) for creating a diagnostic pattern by sampling data from a diagnostic image in which abnormality information is unknown; a determination processing section (18) for determining a substantive feature of the abnormality of the target indicated in the abnormality information in the diagnostic image, based on an output value outputted, in response to an input of the diagnostic pattern, from a learned neural network (17) which is a neural network subjected to learning.
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