Invention Grant
- Patent Title: Detector modules and methods of manufacturing
- Patent Title (中): 检测器模块和制造方法
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Application No.: US13250945Application Date: 2011-09-30
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Publication No.: US08798229B2Publication Date: 2014-08-05
- Inventor: Wen Li , Naresh Kesavan Rao , Abdelaziz Ikhlef , Jeffrey Kautzer
- Applicant: Wen Li , Naresh Kesavan Rao , Abdelaziz Ikhlef , Jeffrey Kautzer
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: The Small Patent Law Group
- Agent Dean D. Small
- Main IPC: A61B6/03
- IPC: A61B6/03 ; H05G1/64

Abstract:
Detector modules and methods of manufacturing are provided. One detector module includes a detector having a silicon wafer structure formed from a first layer having a first resistivity and a second layer having a second resistivity, wherein the first resistivity is greater than the second resistivity. The detector further includes a photosensor device provided with the first layer on a first side of the silicon wafer and one or more readout electronics provided with the second layer on a second side of the silicon wafer, with the first side being a different side than the second side.
Public/Granted literature
- US20130083887A1 DETECTOR MODULES AND METHODS OF MANUFACTURING Public/Granted day:2013-04-04
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