Invention Grant
- Patent Title: Apparatus for detecting temperature of switching elements
- Patent Title (中): 用于检测开关元件温度的装置
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Application No.: US13404220Application Date: 2012-02-24
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Publication No.: US08797700B2Publication Date: 2014-08-05
- Inventor: Yasunari Tanimura , Shinichiro Nakata , Tsuneo Maebara , Yusuke Shindo
- Applicant: Yasunari Tanimura , Shinichiro Nakata , Tsuneo Maebara , Yusuke Shindo
- Applicant Address: JP Kariya
- Assignee: Denso Corporation
- Current Assignee: Denso Corporation
- Current Assignee Address: JP Kariya
- Agency: Nixon & Vanderhye P.C.
- Priority: JP2011-039342 20110225
- Main IPC: H02H5/04
- IPC: H02H5/04

Abstract:
A temperature detecting apparatus includes an integrated circuit that integrates an overheating detecting circuit, a breakage detecting circuit and a disabling circuit, and an element connection terminal connecting a temperature sensing element. The disabling circuit disables the breakage detecting circuit from detecting a breakage of wire when a voltage at the element connection exceeds a disabling threshold which is set higher than an overheating detection threshold and a breakage detection threshold. A predetermined voltage higher than the disabling threshold is applied to the element connection terminal when the temperature sensing element is not connected to the element connection terminal.
Public/Granted literature
- US20120219033A1 APPARATUS FOR DETECTING TEMPERATURE OF SWITCHING ELEMENTS Public/Granted day:2012-08-30
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