Invention Grant
- Patent Title: Optical system for inspecting porous substrates
- Patent Title (中): 用于检查多孔基材的光学系统
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Application No.: US12972167Application Date: 2010-12-17
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Publication No.: US08797395B2Publication Date: 2014-08-05
- Inventor: Kevin George Harding , Yana Zhang Williams , Esmaeil Heidari
- Applicant: Kevin George Harding , Yana Zhang Williams , Esmaeil Heidari
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jenifer E. Haeckl
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G01N21/84 ; G02B21/36

Abstract:
An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
Public/Granted literature
- US20120154560A1 OPTICAL SYSTEM FOR INSPECTING POROUS SUBSTRATES Public/Granted day:2012-06-21
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