Invention Grant
- Patent Title: Sensor device for target particles in a sample
- Patent Title (中): 样品中目标颗粒的传感器装置
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Application No.: US12738317Application Date: 2008-10-21
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Publication No.: US08797028B2Publication Date: 2014-08-05
- Inventor: Coen Adrianus Johannes Verschuren , Josephus Arnoldus Henricus Maria Kahlman , Albert Hendrik Jan Immink , Mischa Megens , Jeroen Veen , Bart Michiel De Boer , Theodorus Petrus Henricus Gerardus Jansen
- Applicant: Coen Adrianus Johannes Verschuren , Josephus Arnoldus Henricus Maria Kahlman , Albert Hendrik Jan Immink , Mischa Megens , Jeroen Veen , Bart Michiel De Boer , Theodorus Petrus Henricus Gerardus Jansen
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP07119248 20071025
- International Application: PCT/IB2008/054329 WO 20081021
- International Announcement: WO2009/053902 WO 20090430
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01N33/00 ; G01N21/55

Abstract:
A sensor device and a method for the determination of the amount of target particles at a contact surface adjacent to a sample chamber include detecting, by a detector, the target particles in the sample chamber by a sensor element, and providing at least one corresponding sensor signal. An evaluation unit determines the amount of target particles in a first zone at the contracts surface and in a second zone a distance away from the contact surface based on this sensor signal. In an optical measurement approach, frustrated total internal reflection taking place under different operating conditions, such as wavelength and/or angle of incidence, may be used to extract information about the first and second zones. In a magnetic measurement approach, different magnetic excitation fields may be used to excite magnetic target particles differently in the first and second zone.
Public/Granted literature
- US20100259254A1 SENSOR DEVICE FOR TARGET PARTICLES IN A SAMPLE Public/Granted day:2010-10-14
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