Invention Grant
- Patent Title: High throughput epitaxial lift off for flexible electronics
- Patent Title (中): 高通量外延剥离柔性电子元件
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Application No.: US14033942Application Date: 2013-09-23
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Publication No.: US08796120B2Publication Date: 2014-08-05
- Inventor: Cheng-Wei Cheng , Kuen-Ting Shiu
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Louis J. Percello
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A method of removing a semiconductor device layer from an underlying base substrate is provided in which a sacrificial phosphide-containing layer is formed between a semiconductor device layer and a base substrate. In some embodiments, a semiconductor buffer layer can be formed on an upper surface of the base substrate prior to forming the sacrificial phosphide-buffer layer. The resultant structure is then etched utilizing a non-HF etchant to release the semiconductor device layer from the base semiconductor substrate. After releasing the semiconductor device layer from the base substrate, the base substrate can be re-used.
Public/Granted literature
- US20140024222A1 HIGH THROUGHPUT EPITAXIAL LIFT OFF FOR FLEXIBLE ELECTRONICS Public/Granted day:2014-01-23
Information query
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