Invention Grant
- Patent Title: Underfill adhesion measurements at a microscopic scale
- Patent Title (中): 在微观尺度下进行底部填充粘附测量
-
Application No.: US13561661Application Date: 2012-07-30
-
Publication No.: US08796049B2Publication Date: 2014-08-05
- Inventor: Maxime Cadotte , Marie-Claude Paquet , Julien Sylvestre
- Applicant: Maxime Cadotte , Marie-Claude Paquet , Julien Sylvestre
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent David Cain
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01L21/00 ; G01N3/24

Abstract:
Methods and systems to method to determine an adhesion force of an underfill material to a chip assembled in a flip-chip module are provided. A method includes forming a flip-chip module including a chip connected to a substrate with a layer of underfill material adhered to the chip and the substrate. The method also includes forming a block from the layer of underfill material. The method further includes measuring a force required to shear the block from a surface of the flip-chip module.
Public/Granted literature
- US20140030827A1 UNDERFILL ADHESION MEASUREMENTS AT A MICROSCOPIC SCALE Public/Granted day:2014-01-30
Information query