Invention Grant
US08796049B2 Underfill adhesion measurements at a microscopic scale 有权
在微观尺度下进行底部填充粘附测量

Underfill adhesion measurements at a microscopic scale
Abstract:
Methods and systems to method to determine an adhesion force of an underfill material to a chip assembled in a flip-chip module are provided. A method includes forming a flip-chip module including a chip connected to a substrate with a layer of underfill material adhered to the chip and the substrate. The method also includes forming a block from the layer of underfill material. The method further includes measuring a force required to shear the block from a surface of the flip-chip module.
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