Invention Grant
US08775876B2 Method to improve I/O reliability on a degraded wide port connection
有权
降低宽端口连接时提高I / O可靠性的方法
- Patent Title: Method to improve I/O reliability on a degraded wide port connection
- Patent Title (中): 降低宽端口连接时提高I / O可靠性的方法
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Application No.: US13302014Application Date: 2011-11-22
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Publication No.: US08775876B2Publication Date: 2014-07-08
- Inventor: Francis A. Wiran
- Applicant: Francis A. Wiran
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Suiter Swantz pc llo
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07

Abstract:
A method and system for controller level identification and isolation of a degraded physical link (PHY) in a serial attached small computer system interface (SA-SCSI) or SAS domain. The method and system uses computer readable code embodied within the controller level of an SAS domain to monitor a plurality of PHY pairs associated as connecting through a wide port. The invention compares a history of PHY pair errors to a tunable timer to determine if PHY errors reach a threshold. Should the threshold be exceeded, the controller disables the error prone PHY pair and delivers a notification. The controller may then re-enable the disabled PHY after user action or port power up.
Public/Granted literature
- US20130132782A1 METHOD TO IMPROVE I/O RELIABILITY ON A DEGRADED WIDE PORT CONNECTION Public/Granted day:2013-05-23
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