Invention Grant
- Patent Title: X-ray apparatus
- Patent Title (中): X光装置
-
Application No.: US13386680Application Date: 2010-09-01
-
Publication No.: US08774484B2Publication Date: 2014-07-08
- Inventor: Nicolaas Jan Noordhoek , Angelique Balguid
- Applicant: Nicolaas Jan Noordhoek , Angelique Balguid
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips N.V.
- Current Assignee: Koninklijke Philips N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09169694 20090908
- International Application: PCT/IB2010/053926 WO 20100901
- International Announcement: WO2011/030257 WO 20110317
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
An X-ray apparatus 10 executes a first scan of an object during a forward movement F and a second scan during a backward movement B. Due to the wiper-like movement of the X-ray imaging device 18 supported by an arm 12 of the X-ray apparatus 10, the time between two scans may be very short.
Public/Granted literature
- US20120155738A1 X-RAY APPARATUS Public/Granted day:2012-06-21
Information query
