Invention Grant
- Patent Title: Systems and methods of measuring latency and routing thereon in optical networks
- Patent Title (中): 在光网络中测量延迟和路由的系统和方法
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Application No.: US12903277Application Date: 2010-10-13
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Publication No.: US08774232B2Publication Date: 2014-07-08
- Inventor: Alexander A. Smith , Vagish Madrahalli , Richard W. Conklin
- Applicant: Alexander A. Smith , Vagish Madrahalli , Richard W. Conklin
- Applicant Address: US MD Linthicum
- Assignee: Ciena Corporation
- Current Assignee: Ciena Corporation
- Current Assignee Address: US MD Linthicum
- Agency: Clements Bernard PLLC
- Agent Christopher L. Bernard; Lawrence A. Baratta, Jr.
- Main IPC: H04J3/06
- IPC: H04J3/06

Abstract:
The present disclosure provides systems and methods for making latency measurements and using these measurements in routing in optical networks. In an exemplary embodiment, a method is defined whereby two nodes sharing a line automatically determine whether both nodes are capable of making a latency measurement and then which node will initiate and which node participates in making the latency measurement. In another exemplary embodiment, an on-demand latency measurement may be made between any two arbitrary nodes within a domain. Routing messages may be used to disseminate the latency of links via a signaling and routing protocol. Advantageously, the present invention provides measurement of latency and latency variation of customer circuits (i.e., SNCs) using an in-band, non-intrusive calculation with a high-degree of accuracy. Furthermore, the present invention may consider these calculations for circuit routing based on the latency and circuit acceptance based on maximum latency restrictions.
Public/Granted literature
- US20110170860A1 SYSTEMS AND METHODS OF MEASURING LATENCY AND ROUTING THEREON IN OPTICAL NETWORKS Public/Granted day:2011-07-14
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