Invention Grant
- Patent Title: Thermometer and temperature measurement method
- Patent Title (中): 温度计和温度测量方法
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Application No.: US13038571Application Date: 2011-03-02
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Publication No.: US08725444B2Publication Date: 2014-05-13
- Inventor: Sakiko Shimizu
- Applicant: Sakiko Shimizu
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Global IP Counselors, LLP
- Priority: JP2010-052827 20100310
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K19/00

Abstract:
A thermometer includes a first surface temperature measurement unit; a first reference temperature measurement unit; a second surface temperature measurement unit; a second reference temperature measurement unit; a temperature correction unit that calculates a mounting positional difference between the first and second surface temperature measurement units from a measurement subject and a mounting positional difference between the first and second reference temperature measurement units from the measurement subject in terms of temperature differences that compensate for temperature dependence, thus correcting the first surface temperature and first reference temperature, or the second surface temperature and second reference temperature; and a core temperature calculation unit that calculates a core temperature of the measurement subject using the first surface temperature and first reference temperature or the second surface temperature and second reference temperature corrected by the temperature correction unit.
Public/Granted literature
- US20110224936A1 THERMOMETER AND TEMPERATURE MEASUREMENT METHOD Public/Granted day:2011-09-15
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