Invention Grant
- Patent Title: Detecting memory failures in computing systems
- Patent Title (中): 检测计算系统中的内存故障
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Application No.: US13355359Application Date: 2012-01-20
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Publication No.: US08707108B1Publication Date: 2014-04-22
- Inventor: Nicholas Alexander Allen
- Applicant: Nicholas Alexander Allen
- Applicant Address: US NV Reno
- Assignee: Amazon Technologies, Inc.
- Current Assignee: Amazon Technologies, Inc.
- Current Assignee Address: US NV Reno
- Agency: Knobbe Martens Olson & Bear, LLP
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Systems and methods for the analysis of memory information of a computing device are provided. One or more user computing devices may transmit memory information to a memory analysis system. The memory analysis system may generate a weighted object graph based on the received memory information, and identify subgraphs to inspect for potential memory use patterns. If such patterns are common in an identified subgraph, they may indicate a potential memory leak. The memory analysis system may further analyze a larger portion of the weighted object graph based on a detected common pattern. Each detected pattern may be ranked based on the likelihood that it corresponds to a memory leak.
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