A method for monitoring operating status of a device includes receiving within a chip, a plurality of signals, each of the plurality of signals being indicative of a power status of a respective one of a plurality of on-chip devices. The method may also include generating from within the chip, a corresponding plurality of output signals. Each of the corresponding plurality of output signals respectively being indicative of the power status of the respective one of the plurality of on-chip devices. Each of the corresponding plurality of output signals may include a clock signal and a data signal. The corresponding plurality of output signals that are indicative of the power status may be output from the chip in a round robin manner. Each of the output signals that are indicative of the power status may be measured in real time by one or more resistor drops within the chip.