Invention Grant
US08705596B2 System and method for physical layer device enabled clock diagnostics
有权
用于物理层设备启用的时钟诊断的系统和方法
- Patent Title: System and method for physical layer device enabled clock diagnostics
- Patent Title (中): 用于物理层设备启用的时钟诊断的系统和方法
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Application No.: US12762422Application Date: 2010-04-19
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Publication No.: US08705596B2Publication Date: 2014-04-22
- Inventor: Wael William Diab , Scott Powell
- Applicant: Wael William Diab , Scott Powell
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Agent Duane S. Kobayashi
- Main IPC: H04B3/36
- IPC: H04B3/36

Abstract:
A system and method for physical layer device enabled clock diagnostics. The physical layer device can monitor the performance of a clock recovery module. Performance monitoring can be performed on the output clock signal or the control components used to generate the output clock signal. In one embodiment, the performance monitoring is correlated to particular data patterns to provide an accurate determination of variations or other inconsistencies within the clock recovery module.
Public/Granted literature
- US20110255427A1 System and Method for Physical Layer Device Enabled Clock Diagnostics Public/Granted day:2011-10-20
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