Invention Grant
- Patent Title: Microscopy method and microscope with enhanced resolution
- Patent Title (中): 显微镜方法和显微镜具有更高的分辨率
-
Application No.: US12913487Application Date: 2010-10-27
-
Publication No.: US08705172B2Publication Date: 2014-04-22
- Inventor: Ingo Kleppe , Ralf Netz , Yauheni Novikau
- Applicant: Ingo Kleppe , Ralf Netz , Yauheni Novikau
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Duane Morris LLP
- Priority: DE102009051291 20091028
- Main IPC: G02B21/06
- IPC: G02B21/06

Abstract:
Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position.
Public/Granted literature
- US20110267688A1 Microscopy Method and Microscope With Enhanced Resolution Public/Granted day:2011-11-03
Information query