Invention Grant
- Patent Title: In-liquid potential measurement device and atomic force microscope
- Patent Title (中): 液体电位测量装置和原子力显微镜
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Application No.: US13882901Application Date: 2011-07-29
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Publication No.: US08695108B2Publication Date: 2014-04-08
- Inventor: Fukuma Takeshi , Kobayashi Naritaka , Asakawa Hitoshi
- Applicant: Fukuma Takeshi , Kobayashi Naritaka , Asakawa Hitoshi
- Applicant Address: JP Kanazawa-shi, Ishikawa
- Assignee: National University Corporation Kanazawa University
- Current Assignee: National University Corporation Kanazawa University
- Current Assignee Address: JP Kanazawa-shi, Ishikawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2010-248744 20101105
- International Application: PCT/JP2011/004325 WO 20110729
- International Announcement: WO2012/060033 WO 20120510
- Main IPC: G01Q70/04
- IPC: G01Q70/04 ; G01Q10/00

Abstract:
To measure surface potentials in a liquid, the in-liquid potential measurement device according to the present invention includes: a cantilever having a probe at its free end; a displacement measurement unit that measures a voltage corresponding to a displacement of a tip of the cantilever; an AC source that applies an AC voltage between the probe and the sample; and a signal detection unit. A frequency of the AC voltage is 10 kHz or higher. The signal detection unit detects, from the voltage measured by the displacement measurement unit, an amplitude of a frequency component having the same frequency as that of the AC voltage, an amplitude of a frequency component having double frequency of that of the AC voltage, and a frequency component having the same phase as that of the frequency of the AC voltage.
Public/Granted literature
- US20130232648A1 IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE Public/Granted day:2013-09-05
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