Invention Grant
- Patent Title: Marker determination device, marker determination detection system, marker determination detection device, marker, marker determination method, and program therefor
- Patent Title (中): 标记确定装置，标记确定检测系统，标记确定检测装置，标记，标记确定方法及其程序
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Application No.: US13386306Application Date: 2010-07-22
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Publication No.: US08693786B2Publication Date: 2014-04-08
- Inventor: Noboru Nakajima
- Applicant: Noboru Nakajima
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-171842 20090723
- International Application: PCT/JP2010/062384 WO 20100722
- International Announcement: WO2011/010707 WO 20110127
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
Provided is a marker judgment device which has a feature storage means and a feature comparison means. The feature storage means disposes feature points extracted from an image in a predetermined space, sets parts in which the number of feature points in the predetermined space is equal to or less than a predetermined number as singular features, and stores the singular features and feature points extracted from an existing mark. The feature comparison means disposes the feature points extracted from the existing mark in the predetermined space, and judges that the existing mark is capable of being used as a marker which is detectable from the image, when the number of feature points that coincide with the singular features is equal to or more than a predetermined number.
Public/Granted literature
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