Invention Grant
US08693735B2 System and method for precision measurement of position, motion and resonances
有权
用于精确测量位置，运动和共振的系统和方法
- Patent Title: System and method for precision measurement of position, motion and resonances
- Patent Title (中): 用于精确测量位置，运动和共振的系统和方法
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Application No.: US13410156Application Date: 2012-03-01
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Publication No.: US08693735B2Publication Date: 2014-04-08
- Inventor: John F. Kielkopf , Jeffrey Hay
- Applicant: John F. Kielkopf , Jeffrey Hay
- Applicant Address: US KY Louisville
- Assignee: University of Louisville Research Foundation, Inc.
- Current Assignee: University of Louisville Research Foundation, Inc.
- Current Assignee Address: US KY Louisville
- Agency: Wyatt, Tarrant & Combs, LLP
- Agent Stephen C. Hall
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B9/02
Abstract:
A non-contact sensing system for measuring and analyzing an object's position, motion, and/or resonance utilizes optical capturing of image features, data extraction, and signal processing to determine changes in the object's motion or position according to changes in signals, which are associated with the excitation of photons due to the object's motion.
Public/Granted literature
- US20120243747A1 System and Method for Precision Measurement of Position, Motion and Resonances Public/Granted day:2012-09-27
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