Invention Grant
US08693529B2 Method for enabling a device under test (DUT) to retry a portion of a pre-defined test sequence
有权
允许被测设备(DUT)重试预定义测试序列的一部分的方法
- Patent Title: Method for enabling a device under test (DUT) to retry a portion of a pre-defined test sequence
- Patent Title (中): 允许被测设备(DUT)重试预定义测试序列的一部分的方法
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Application No.: US13437652Application Date: 2012-04-02
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Publication No.: US08693529B2Publication Date: 2014-04-08
- Inventor: Christian Volf Olgaard , Ruizu Wang , Guy Shaviv
- Applicant: Christian Volf Olgaard , Ruizu Wang , Guy Shaviv
- Applicant Address: US CA Sunnyvale
- Assignee: Litepoint Corporation
- Current Assignee: Litepoint Corporation
- Current Assignee Address: US CA Sunnyvale
- Main IPC: H04B3/46
- IPC: H04B3/46

Abstract:
Execution of a block test “retry” in a test environment with each block in the test sequence sent after the tester has determined that the previous block of data packets has met one or more prescribed test criterion. If a block sent by the DUT has not met the test criterion, a retry sequence is initiated to re-test the block. In another embodiment, a block test “retry” is executed where each block in the test sequence is sent and analysis of previously sent blocks is done in parallel with the sending of a subsequent block. If a previous block has not met the test criterion, a retry sequence is initiated whereby the tester and DUT step back to the block that failed to meet the test criterion and retry that block. If the retry meets test criterion, testing continues by resuming with the next untested block in the sequence.
Public/Granted literature
- US20130259097A1 METHOD FOR ENABLING A DEVICE UNDER TEST (DUT) TO RETRY A PORTION OF A PRE-DEFINED TEST SEQUENCE Public/Granted day:2013-10-03
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