Invention Grant
- Patent Title: Device for measuring three dimensional shape
- Patent Title (中): 用于测量三维形状的装置
-
Application No.: US13559881Application Date: 2012-07-27
-
Publication No.: US08693007B2Publication Date: 2014-04-08
- Inventor: Hiroyuki Ishigaki
- Applicant: Hiroyuki Ishigaki
- Applicant Address: JP Aichi
- Assignee: CKD Corporation
- Current Assignee: CKD Corporation
- Current Assignee Address: JP Aichi
- Agency: Osha Liang LLP
- Priority: JP2011-251171 20111117
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A device for measuring three dimensional shape includes a first height data acquisition unit for acquiring a height data specified from measurement values according to a multiplicity of light patterns related to an entirely irradiated region irradiated by all of the multiplicity of light patterns, and for using an acquired specified height data as a height data for the entirely irradiated region; a supplemental data acquisition unit for acquiring, based on the height data for the entirely irradiated region, a supplemental data relating to a partially irradiated region that is irradiated by only part of the multiplicity of light patterns; and a second height acquisition unit for specifying a fringe order of the measurement values for the partially irradiated region based on the supplemental data, and for acquiring as height data for the partially irradiated region a height data corresponding to the measurement values of the specified fringe order.
Public/Granted literature
- US20130128282A1 DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE Public/Granted day:2013-05-23
Information query