Invention Grant
US08692984B2 Field tester for topologies utilizing array connectors and multi-wavelength field tester for topologies utilizing array connectors
有权
使用阵列连接器的拓扑现场测试仪和利用阵列连接器的拓扑的多波长场测试仪
- Patent Title: Field tester for topologies utilizing array connectors and multi-wavelength field tester for topologies utilizing array connectors
- Patent Title (中): 使用阵列连接器的拓扑现场测试仪和利用阵列连接器的拓扑的多波长场测试仪
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Application No.: US13362567Application Date: 2012-01-31
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Publication No.: US08692984B2Publication Date: 2014-04-08
- Inventor: J. David Schell , Seymour Goldstein , Harlan Kassler , Jackson Salling
- Applicant: J. David Schell , Seymour Goldstein , Harlan Kassler , Jackson Salling
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Edwards Wildman Palmer LLP
- Agent Scott D. Wofsy; Christopher J. Capelli
- Main IPC: G01N21/00
- IPC: G01N21/00
Abstract:
A test instrument comprises plural first optical signal sources at a first wavelength and a distributor coupled to the plural first optical signal sources to supply the signals produced to a multi-fiber test port. Additional second wavelength signal sources may be provided, and a second test instrument for use at a second end of the link under test may be provided, to effect testing of the optical link.
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