Invention Grant
- Patent Title: Probe card for testing high-frequency signals
- Patent Title (中): 用于测试高频信号的探针卡
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Application No.: US13105321Application Date: 2011-05-11
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Publication No.: US08692570B2Publication Date: 2014-04-08
- Inventor: Choon Leong Lou , Chih Kun Chen
- Applicant: Choon Leong Lou , Chih Kun Chen
- Applicant Address: TW Hsinchu
- Assignee: Star Technologies Inc.
- Current Assignee: Star Technologies Inc.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C.
- Agent Anthony King; Kay Yang
- Priority: TW99115629A 20100517
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A probe card includes a circuit board, a flexible substrate, and a plurality of probes. The flexible substrate includes a plurality of arrayed conductive strips. The plurality of conductive strips is electrically connected to the printed circuit board. The plurality of probes is fixed to the printed circuit board, and the end of each probe is attached to one corresponding conductive strip.
Public/Granted literature
- US20110279139A1 PROBE CARD FOR TESTING HIGH-FREQUENCY SIGNALS Public/Granted day:2011-11-17
Information query
