Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US13118585Application Date: 2011-05-31
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Publication No.: US08692566B2Publication Date: 2014-04-08
- Inventor: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Shinichi Ishikawa , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/00
- IPC: G01R31/00

Abstract:
Provided is a test apparatus comprising a plurality of testing sections and a synchronizing section that synchronizes operation of at least two testing sections among the plurality of testing sections. Each testing section transmits a synchronization standby command to the synchronizing section when a predetermined condition is fulfilled during execution of the corresponding program and the testing section enters a synchronization standby state, and on a condition that the synchronization standby commands have been received from all of one or more predetermined testing sections among the plurality of testing sections, the synchronizing section supplies a synchronization signal, which ends the synchronization standby state, in synchronization to two or more predetermined testing sections among the plurality of testing sections.
Public/Granted literature
- US20120133380A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2012-05-31
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