Invention Grant
- Patent Title: Methods and circuits for measuring mutual and self capacitance
- Patent Title (中): 用于测量相互和自身电容的方法和电路
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Application No.: US13720861Application Date: 2012-12-19
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Publication No.: US08692563B1Publication Date: 2014-04-08
- Inventor: Andriy Maharyta
- Applicant: Cypress Semiconductor Corporation
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G06F3/041 ; G06F3/045

Abstract:
In an example embodiment, an apparatus includes a sensing device. The sensing device includes circuitry configured to sense self-capacitance and circuitry configured to sense mutual-capacitance, each configured to detect capacitance values corresponding to whether an object is proximate to a touch screen. The sensing device is configured to measure a first capacitance value using the self-capacitance circuitry during self-capacitance sensing operations and to measure a second capacitance value using the mutual-capacitance circuitry during mutual-capacitance sensing operations.
Public/Granted literature
- US3079056A Switchable drive system Public/Granted day:1963-02-26
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