Invention Grant
- Patent Title: Method of manufacturing plasmon generator
- Patent Title (中): 等离子体发生器的制造方法
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Application No.: US13731754Application Date: 2012-12-31
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Publication No.: US08691102B1Publication Date: 2014-04-08
- Inventor: Hironori Araki , Yoshitaka Sasaki , Hiroyuki Ito , Yukinori Ikegawa , Seiichiro Tomita , Shigeki Tanemura
- Applicant: Hironori Araki , Yoshitaka Sasaki , Hiroyuki Ito , Yukinori Ikegawa , Seiichiro Tomita , Shigeki Tanemura
- Applicant Address: US CA Milpitas
- Assignee: Headway Technologies, Inc.
- Current Assignee: Headway Technologies, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Oliff PLC
- Main IPC: C03C15/00
- IPC: C03C15/00

Abstract:
A method of manufacturing a plasmon generator includes the steps of: forming an etching mask on a dielectric layer; forming an accommodation part by etching the dielectric layer using the etching mask; and forming the plasmon generator to be accommodated in the accommodation part. The step of forming the etching mask includes the steps of: forming a patterned layer on an etching mask material layer, the patterned layer having a first opening that has a sidewall; forming a structure by forming an adhesion film on the sidewall, the structure having a second opening smaller than the first opening; and etching a portion of the etching mask material layer exposed from the second opening.
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