Invention Grant
- Patent Title: System and method for analyzing alternatives in test plans
- Patent Title (中): 用于分析测试计划中的替代方法的系统和方法
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Application No.: US12557886Application Date: 2009-09-11
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Publication No.: US08689188B2Publication Date: 2014-04-01
- Inventor: Kathryn A. Bassin , Howard M. Hess , Steven Kagan , Shao C. Li , Zhong J. Li , He H. Liu , Susan E. Skrabanek , Hua F. Tan , Jun Zhu
- Applicant: Kathryn A. Bassin , Howard M. Hess , Steven Kagan , Shao C. Li , Zhong J. Li , He H. Liu , Susan E. Skrabanek , Hua F. Tan , Jun Zhu
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Matthew Chung
- Main IPC: G06F9/44
- IPC: G06F9/44
Abstract:
A method includes creating an initial test plan including initial estimates of effort and defect distributions, creating an alternative test plan including alternative estimates of effort and defect distributions, and displaying at least one metric of the initial test plan and the alternative test plan side by side for comparison by a user.
Public/Granted literature
- US20110066890A1 SYSTEM AND METHOD FOR ANALYZING ALTERNATIVES IN TEST PLANS Public/Granted day:2011-03-17
Information query
