Invention Grant
- Patent Title: Predictive run testing
- Patent Title (中): 预测运行测试
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Application No.: US11801037Application Date: 2007-05-07
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Publication No.: US08689187B2Publication Date: 2014-04-01
- Inventor: Steven G. Esposito , Kiran Chhabra , Saran Prasad , D. Scott Baeder
- Applicant: Steven G. Esposito , Kiran Chhabra , Saran Prasad , D. Scott Baeder
- Applicant Address: US CA San Jose
- Assignee: Cadence Design Systems, Inc.
- Current Assignee: Cadence Design Systems, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Alford Law Group, Inc.
- Agent Tobi C. Clinton
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A test object can be selectively included in a test run based on predicting the behavior of the test object. In one embodiment, the present invention includes predicting how likely the test object is to produce a failure in a test run and deciding whether to include the test object in the test run based on the predicted likelihood. This likelihood of producing a failure may be based on any number of circumstances. For example, these circumstances may include the history of prior failures and/or the length of time since the test object was last included in a test run.
Public/Granted literature
- US20080282124A1 Predictive run testing Public/Granted day:2008-11-13
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