Invention Grant
- Patent Title: Method of proving formal test bench fault detection coverage
- Patent Title (中): 证明正式测试台故障检测覆盖的方法
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Application No.: US13626249Application Date: 2012-09-25
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Publication No.: US08689155B1Publication Date: 2014-04-01
- Inventor: Darren Galpin
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Some aspects of the present disclosure provide for a system and method to discover which parts of a design a formal test suite can detect faults in, and thus how much of a design structure is covered by a property set. A mutatable RTL design is defined which allows for modification of a part of an RTL design from its intended behavior to a non-intended behavior, thus introducing unwanted effects. The mutatable RTL design can then be synthesized to produce a functional representation of the design. The property set can be re-run on the synthesized design to see whether the functional representation of the design is sensitive to the unwanted effect and thus whether formal verification can detect the modification.
Public/Granted literature
- US20140089872A1 METHOD OF PROVING FORMAL TEST BENCH FAULT DETECTION COVERAGE Public/Granted day:2014-03-27
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