Invention Grant
US08689064B1 Apparatus and method for self-test in a multi-rank memory module 有权
用于多级存储器模块中的自检的装置和方法

  • Patent Title: Apparatus and method for self-test in a multi-rank memory module
  • Patent Title (中): 用于多级存储器模块中的自检的装置和方法
  • Application No.: US13745790
    Application Date: 2013-01-19
  • Publication No.: US08689064B1
    Publication Date: 2014-04-01
  • Inventor: Hyun LeeJayesh R. BhaktaSoonju Choi
  • Applicant: Netlist, Inc.
  • Applicant Address: US CA Irvine
  • Assignee: Netlist, Inc.
  • Current Assignee: Netlist, Inc.
  • Current Assignee Address: US CA Irvine
  • Agent James J. Zheng, Esq.
  • Main IPC: G11C29/00
  • IPC: G11C29/00
Apparatus and method for self-test in a multi-rank memory module
Abstract:
A memory module for operating with a system memory controller comprises a plurality of data ports, a plurality of memory devices organized in ranks, and a plurality of data handlers. Each respective data handler is coupled to a respective set of data ports of the plurality of data ports and to a respective set of memory devices of the plurality of memory devices. Each set of memory devices include at least one memory device from each rank. In a normal mode, each respective data handler is configured to provide write data received from the system memory controller via the respective data ports to the respective set of memory devices. In a test mode, each respective data handler is configured to provide test data generated in the respective data handler to the respective set of memory devices.
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