Invention Grant
- Patent Title: Detecting impact of extrinsic events on a time series
- Patent Title (中): 检测外部事件对时间序列的影响
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Application No.: US13162927Application Date: 2011-06-17
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Publication No.: US08688417B2Publication Date: 2014-04-01
- Inventor: Alex Bocharov , Christopher A. Meek , Bo Thiesson
- Applicant: Alex Bocharov , Christopher A. Meek , Bo Thiesson
- Applicant Address: US WA Redmond
- Assignee: Microsoft Corporation
- Current Assignee: Microsoft Corporation
- Current Assignee Address: US WA Redmond
- Agent Holly Nguyen; Carole Boelitz; Micky Minhas
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
In one embodiment, an event impact signature detector may analyze a time series with external events. A data interface 250 may receive a data set 310 representing the time series with external events. A processor 220 may fit the data set 310 into a baseline time series model 330. The processor 220 may iteratively determine each event location 352 for multiple external events 350 affecting the baseline time series model 330. The processor 220 may iteratively solve for each event impact 354 of the multiple external events 350 factoring in interactions between the multiple external events 350.
Public/Granted literature
- US20120323537A1 DETECTING IMPACT OF EXTRINSIC EVENTS ON A TIME SERIES Public/Granted day:2012-12-20
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