Invention Grant
- Patent Title: Operation monitoring system for processing apparatus
- Patent Title (中): 加工设备操作监控系统
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Application No.: US13054107Application Date: 2009-07-21
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Publication No.: US08688246B2Publication Date: 2014-04-01
- Inventor: Yoshinori Fujii
- Applicant: Yoshinori Fujii
- Applicant Address: JP Kanagawa
- Assignee: Ulvac, Inc.
- Current Assignee: Ulvac, Inc.
- Current Assignee Address: JP Kanagawa
- Agency: Cermak Nakajima LLP
- Agent Tomoko Nakajima
- Priority: JP2008-190629 20080724
- International Application: PCT/JP2009/003413 WO 20090721
- International Announcement: WO2010/010688 WO 20100128
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
In a processing apparatus having: moveable parts disposed to form a predetermined processing environment within a processing chamber in which a predetermined processing is performed on an object to be processed; and a control means for controlling the operation of each of the moveable parts, abnormality inclusive of deterioration with time of the moveable parts constituting the processing apparatus is made to be easily judged. There is provided a vibration detection means for detecting the waveforms of vibrations that occur accompanied by the operation of the moveable parts. When control is made from the control means in order to operate any one of the moveable parts, there are obtained event data corresponding to the control and the waveforms of vibrations of all the moveable parts that are operating simultaneously at the time in question. Each time the control corresponding to the event data is selected, or when a waveform of vibration corresponding to another event data of the same kind as that of the above-mentioned event data has been obtained, the change in the waveform is monitored. When the waveform has changed beyond a predetermined range, the processing apparatus is judged to be abnormal.
Public/Granted literature
- US20110125331A1 OPERATION MONITORING SYSTEM FOR PROCESSING APPARATUS Public/Granted day:2011-05-26
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