Invention Grant
- Patent Title: Posture state detection using selectable system control parameters
- Patent Title (中): 姿态检测采用可选择的系统控制参数
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Application No.: US12433029Application Date: 2009-04-30
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Publication No.: US08688225B2Publication Date: 2014-04-01
- Inventor: Eric J. Panken , Dennis M. Skelton
- Applicant: Eric J. Panken , Dennis M. Skelton
- Applicant Address: unknown Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: unknown Minneapolis
- Agent Beth L. McMahon
- Main IPC: A61N1/00
- IPC: A61N1/00

Abstract:
Techniques for detecting and classifying a posture state of a patient are disclosed, wherein a posture state includes at least one of a posture and/or an activity state related to motion. In one embodiment, one or more signals indicative of at least one of posture and activity state of the patient may be sensed by a sensor. Control logic may be provided to process the one or more sensed signals in a selectable manner. This selectable manner may be based on current posture state data describing a posture state in which the patient has previously been classified. Alternatively or additionally, this current posture state data may describe a posture state transition previously undergone by the patient. The one or more signals that are so processed may then be used to classify a posture state of the patient.
Public/Granted literature
- US20100010384A1 POSTURE STATE DETECTION USING SELECTABLE SYSTEM CONTROL PARAMETERS Public/Granted day:2010-01-14
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