Invention Grant
US08688060B2 Detection circuit for overdrive conditions in a wireless device 有权
用于无线设备中超速条件的检测电路

  • Patent Title: Detection circuit for overdrive conditions in a wireless device
  • Patent Title (中): 用于无线设备中超速条件的检测电路
  • Application No.: US12487549
    Application Date: 2009-06-18
  • Publication No.: US08688060B2
    Publication Date: 2014-04-01
  • Inventor: Douglas Sudjian
  • Applicant: Douglas Sudjian
  • Applicant Address: US CA San Diego
  • Assignee: QUALCOMM Incorporated
  • Current Assignee: QUALCOMM Incorporated
  • Current Assignee Address: US CA San Diego
  • Agent Ramin Mobarhan
  • Main IPC: H01Q11/12
  • IPC: H01Q11/12 H04K3/00
Detection circuit for overdrive conditions in a wireless device
Abstract:
A detection circuit that can accurately detect signal peak is described. In an exemplary design, the detection circuit includes a bias voltage generator and a MOS transistor. The bias voltage generator provides a bias voltage as a function of temperature. The MOS transistor receives an input RF signal and the bias voltage and provides a rectified signal, which may be a linear function of the input RF signal and may have reduced deviation with temperature due to the bias voltage. The bias voltage generator may generate the bias voltage based on a temperature-dependent current having a slope selected to reduce deviation in the rectified signal with temperature. An offset canceller may cancel a reference voltage from the rectified signal and provide an output signal. A bulk bias generator may generate a bulk voltage for the bulk of the MOS transistor as a function of temperature to improve operating speed at higher temperature.
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