Invention Grant
- Patent Title: Apparatus and method for phase noise self-test
- Patent Title (中): 相位噪声自检装置及方法
-
Application No.: US13342687Application Date: 2012-01-03
-
Publication No.: US08688052B2Publication Date: 2014-04-01
- Inventor: Tamas Marozsak , Pio Balmelli
- Applicant: Tamas Marozsak , Pio Balmelli
- Applicant Address: US TX Austin
- Assignee: Silicon Laboratories Inc.
- Current Assignee: Silicon Laboratories Inc.
- Current Assignee Address: US TX Austin
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Erik A. Heter
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
An integrated circuit (IC) having a radio receiver configured to perform a jitter self-test is disclosed. In one embodiment, an IC includes a radio receiver and a pulse generator. The pulse generator is configured to generate a pulse train based on a first periodic signal received from the radio receiver. The radio receiver is configured to use the pulse train to determine an amount of phase noise generated by a local oscillator of the radio receiver. The pulse generator and the radio receiver are implemented on the same IC die.
Public/Granted literature
- US20130170532A1 APPARATUS AND METHOD FOR PHASE NOISE SELF-TEST Public/Granted day:2013-07-04
Information query