Invention Grant
US08687957B2 Method and apparatus for deriving parameters of optical paths in optical networks using two-wavelength OTDR and a wavelength-dependent reflective element 有权
使用双波长OTDR和波长依赖反射元件导出光网络中光路参数的方法和装置

  • Patent Title: Method and apparatus for deriving parameters of optical paths in optical networks using two-wavelength OTDR and a wavelength-dependent reflective element
  • Patent Title (中): 使用双波长OTDR和波长依赖反射元件导出光网络中光路参数的方法和装置
  • Application No.: US13124455
    Application Date: 2009-10-19
  • Publication No.: US08687957B2
    Publication Date: 2014-04-01
  • Inventor: Stéphane Perron
  • Applicant: Stéphane Perron
  • Applicant Address: CA Quebec, QC
  • Assignee: EXFO Inc.
  • Current Assignee: EXFO Inc.
  • Current Assignee Address: CA Quebec, QC
  • International Application: PCT/CA2009/001493 WO 20091019
  • International Announcement: WO2010/043056 WO 20100422
  • Main IPC: H04B17/00
  • IPC: H04B17/00
Method and apparatus for deriving parameters of optical paths in optical networks using two-wavelength OTDR and a wavelength-dependent reflective element
Abstract:
A method of distinguishing a wavelength-dependent reflective element (HRD) from wavelength-independent events in an optical network, the reflective element (HRD) being highly-reflective at a first predetermined wavelength (λ1) and significantly less reflective at least one other predetermined wavelength (λ2), comprising the steps of: connecting the wavelength-dependent reflective element (HRD) to said optical path at a first position, and, using an optical time domain reflectometer (22) connected to said optical path at a position remote from said reflective element, launching into said optical path light at said first wavelength (λ1) and at said second wavelength (λ2), detecting corresponding backreflected light from said optical paths and obtaining therefrom first and second OTDR traces (OTDR-λ1, OTDR-λ2) corresponding to said first (λ1) and second (λ2) wavelengths, respectively, of detected backreflected light as a function of optical distance from said point; comparing the first and second OTDR traces to distinguish a peak corresponding to said wavelength-dependent reflective element from peaks corresponding to said wavelength-independent reflective events; and outputting at least one parameter value of the distinguished peak as a measure of a parameter of said wavelength-dependent reflective element.
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