Invention Grant
- Patent Title: Optical characteristic measuring probe
- Patent Title (中): 光学特性测量探头
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Application No.: US13318998Application Date: 2010-03-03
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Publication No.: US08687928B2Publication Date: 2014-04-01
- Inventor: Soh Ohzawa
- Applicant: Soh Ohzawa
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta Opto, Inc.
- Current Assignee: Konica Minolta Opto, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: JP2009-112486 20090507
- International Application: PCT/JP2010/053412 WO 20100303
- International Announcement: WO2010/128605 WO 20101111
- Main IPC: G02B6/26
- IPC: G02B6/26 ; G02B6/42

Abstract:
Provided is an optical characteristic measuring probe which can detect the position and the direction of the leading end of the probe without affecting a monitoring image. The bendable optical characteristic measuring probe is provided with a light guide body (71), which transmits light emitted from a light source and irradiates a subject to be measured with light, and a guide tube (70), which holds the light guide body (71) such that the light guide body freely rotates about the axis and is freely displaced in the axis direction. The light guide body (71) guides at least two types of light, i.e., measuring light for measuring the optical characteristics of the subject to be measured, and position determining light for measuring the position of the light guide body. On the side surface of the guide tube (70), a mark (M) having the characteristics of transmitting the measuring light and returning only the position determining light to the light guide body is provided.
Public/Granted literature
- US20120057149A1 Optical Characteristic Measuring Probe Public/Granted day:2012-03-08
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