Invention Grant
- Patent Title: Storage device testing system cooling
- Patent Title (中): 存储设备测试系统冷却
-
Application No.: US12698575Application Date: 2010-02-02
-
Publication No.: US08687356B2Publication Date: 2014-04-01
- Inventor: Brian S. Merrow
- Applicant: Brian S. Merrow
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Fish & Richardson P.C.
- Main IPC: H05K7/20
- IPC: H05K7/20

Abstract:
A storage device testing system that includes at least one rack, test slots housed by each rack, and at least one air mover in pneumatic communication with the test slots. Each test slot includes a test slot housing having an entrance and an exit, with the entrance configured to receive a storage device. The at least one air mover is configured to move air exterior to the racks into the entrance of each test slot housing, over the received storage device, and out of the exit of each test slot housing.
Public/Granted literature
- US20110189934A1 Storage Device Testing System Cooling Public/Granted day:2011-08-04
Information query