Invention Grant
- Patent Title: Method and apparatus for measuring refractive index based on a ratio between a number of second fringes divided by a difference of the number of second fringes minus a number of first fringes
- Patent Title (中): 用于根据第二条纹的数量除以第二条纹数减去第一条纹数量之差的比率来测量折射率的方法和装置
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Application No.: US13071383Application Date: 2011-03-24
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Publication No.: US08687204B2Publication Date: 2014-04-01
- Inventor: Chung-Chieh Yu
- Applicant: Chung-Chieh Yu
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Main IPC: G01N21/41
- IPC: G01N21/41

Abstract:
A method and apparatus for measuring refractive index of an object are disclosed. The method includes, acquiring a number of first fringes of a first interference pattern formed by interference of a first beam of light transmitted through the object with a second beam of light not transmitted through the object; acquiring a number of second fringes of a second interference pattern formed by interference of a third beam of light reflected from a first surface of the object with a fourth beam of light transmitted through the object and reflected from a second surface of the object; and calculating the refractive index of the object based on the number of first fringes and the number of second fringes. The method may further include calculating the Abbe number of the object based on the refractive indices of the object measured at different wavelengths.
Public/Granted literature
- US20120243002A1 METHOD AND APPARATUS FOR MEASURING REFRACTIVE INDEX Public/Granted day:2012-09-27
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