Invention Grant
- Patent Title: Optical measurement apparatus and chip lifetime judgment method
- Patent Title (中): 光学测量装置和芯片寿命判断方法
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Application No.: US13568901Application Date: 2012-08-07
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Publication No.: US08687195B2Publication Date: 2014-04-01
- Inventor: Yosuke Muraki
- Applicant: Yosuke Muraki
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2011-175990 20110811
- Main IPC: G01N21/59
- IPC: G01N21/59
Abstract:
An optical measurement apparatus including a light irradiation portion configured to irradiate light onto a sample flowing through a flow path in a detachable chip; a light detection portion configured to detect optical information emitted from the sample when irradiated with the light by the light irradiation portion; and a judgment portion configured to judge an exchange period of the chip based on the optical information detected by the light detection portion.
Public/Granted literature
- US20130038878A1 OPTICAL MEASUREMENT APPARATUS AND CHIP LIFETIME JUDGMENT METHOD Public/Granted day:2013-02-14
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