Invention Grant
US08687185B2 Device and method for optical parallel analysis of a sample arrangement and corresponding manufacturing method
有权
用于样品布置的光学并行分析的装置和方法及相应的制造方法
- Patent Title: Device and method for optical parallel analysis of a sample arrangement and corresponding manufacturing method
- Patent Title (中): 用于样品布置的光学并行分析的装置和方法及相应的制造方法
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Application No.: US13023078Application Date: 2011-02-08
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Publication No.: US08687185B2Publication Date: 2014-04-01
- Inventor: Martina Daub , Jochen Rupp
- Applicant: Martina Daub , Jochen Rupp
- Applicant Address: DE Stuttgart
- Assignee: Robert Bosch GmbH
- Current Assignee: Robert Bosch GmbH
- Current Assignee Address: DE Stuttgart
- Agency: Kenyon & Kenyon LLP
- Priority: DE102010001714 20100209
- Main IPC: G01N1/10
- IPC: G01N1/10 ; G01N21/01 ; G01N21/00

Abstract:
A device and a method for optical parallel analysis of a sample arrangement. The device includes a system of sample areas provided on and/or in a front face of the carrier substrate for receiving a sample substance; a system of detector areas provided on and/or in a back face of the carrier substrate, each detector area being assigned to a corresponding sample area; and a system of optical devices, each optical system being assigned to a corresponding sample area and being designed in such a way that it deflects light beams, which the corresponding sample area in response to an optical excitation does not emit in the direction of a detector area assigned to it, in the direction of the detector area assigned to it and/or in the direction of a detector-free area on the back face of the carrier substrate.
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