Invention Grant
- Patent Title: Three-dimensional measurement apparatus and control method therefor
- Patent Title (中): 三维测量装置及其控制方法
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Application No.: US12977031Application Date: 2010-12-22
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Publication No.: US08687057B2Publication Date: 2014-04-01
- Inventor: Kazuhiko Kobayashi , Shinji Uchiyama
- Applicant: Kazuhiko Kobayashi , Shinji Uchiyama
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2010-001561 20100106
- Main IPC: H04N15/00
- IPC: H04N15/00 ; H04N13/00 ; H04N9/47 ; H04N7/18

Abstract:
A three-dimensional measurement apparatus generates patterns to be projected onto the measurement object, images the measurement object using an imaging unit after projecting a plurality of types of generated patterns onto the measurement object using a projection unit, and computes the coordinate values of patterns on a captured image acquired by the imaging unit, based on the projected patterns, a geometric model of the measurement object, and information indicating the coarse position and orientation of the measurement object. Captured patterns on the captured image are corresponded with the patterns projected by the projection unit using the computed coordinate values, and the distances between the imaging unit and the patterns projected onto the measurement object are derived. The position and orientation of the measurement object are estimated using the derived distances and the geometric model of the measurement object, and the information on the coarse position and orientation is updated.
Public/Granted literature
- US20110164114A1 THREE-DIMENSIONAL MEASUREMENT APPARATUS AND CONTROL METHOD THEREFOR Public/Granted day:2011-07-07
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