Invention Grant
- Patent Title: Bench-top measurement method, apparatus and system for phased array radar apparatus calibration
- Patent Title (中): 台式测量方法，相控阵雷达装置校准装置和系统
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Application No.: US13025652Application Date: 2011-02-11
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Publication No.: US08686896B2Publication Date: 2014-04-01
- Inventor: Harvey K. Schuman , Anthony M. Davis , Donald M. McPherson , Michael Robinson , David R. Hagenmayer , John G. Wiley
- Applicant: Harvey K. Schuman , Anthony M. Davis , Donald M. McPherson , Michael Robinson , David R. Hagenmayer , John G. Wiley
- Applicant Address: US NY North Syracuse
- Assignee: SRC, Inc.
- Current Assignee: SRC, Inc.
- Current Assignee Address: US NY North Syracuse
- Agency: Bond Schoeneck & King, PLLC
- Agent George R. McGuire; Blaine T. Bettinger
- Main IPC: G01S7/40
- IPC: G01S7/40 ; H01Q3/26 ; G01S7/00 ; H01Q3/00
Abstract:
A method for determining beamformer scattering parameters for a plurality of phased array radar antenna subarrays that each include a radiating (e.g., dipole) component and a beamformer component provides for obtaining for the plurality of phased array radar antenna subarrays a plurality of electromagnetic measurements at a plurality of ports. Analogous electromagnetic measurements are obtained for a reference subarray including a radiating component but absent a beamformer component. The plurality of phased array radar antenna subarray electromagnetic measurements and the reference subarray electromagnetic measurements provide a plurality of beamformer scattering parameter values for the plurality of phased array radar antenna subarrays that may be used in modeling and calibrating a phased array radar apparatus that may be assembled from the plurality of phased array radar antenna subarrays.
Public/Granted literature
- US20120206291A1 BENCH-TOP MEASUREMENT METHOD, APPARATUS AND SYSTEM FOR PHASED ARRAY RADAR APPARATUS CALIBRATION Public/Granted day:2012-08-16
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