Invention Grant
- Patent Title: Method and system for testing oscillator circuit
- Patent Title (中): 振荡电路测试方法及系统
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Application No.: US13462823Application Date: 2012-05-03
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Publication No.: US08686798B2Publication Date: 2014-04-01
- Inventor: Jun Zhang , Xiuqiang Xu
- Applicant: Jun Zhang , Xiuqiang Xu
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Priority: CN201110131708 20110519
- Main IPC: H03L5/00
- IPC: H03L5/00 ; G01R19/04
Abstract:
An oscillator circuit generates a voltage signal. The magnitude of the voltage signal is measured and compared with predetermined upper and lower voltage signals by an internal test circuit. If the magnitude of the voltage signal is between the predetermined upper and lower voltage signals, then a pass test status signal is generated. If the magnitude of the voltage signal is not between the predetermined upper and lower voltage signals then a fail test status signal is generated.
Public/Granted literature
- US20120293270A1 METHOD AND SYSTEM FOR TESTING OSCILLATOR CIRCUIT Public/Granted day:2012-11-22
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