Invention Grant
- Patent Title: Calibration of linear time-invariant system's step response
- Patent Title (中): 线性时变不变系统阶跃响应的校准
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Application No.: US12989909Application Date: 2009-04-30
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Publication No.: US08686779B2Publication Date: 2014-04-01
- Inventor: Dennis Jeurissen , Gerben Willem De Jong , Jan Van Sinderen
- Applicant: Dennis Jeurissen , Gerben Willem De Jong , Jan Van Sinderen
- Applicant Address: NL Eindhoven
- Assignee: NXP, B.V.
- Current Assignee: NXP, B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP08103829 20080506
- International Application: PCT/IB2009/051762 WO 20090430
- International Announcement: WO2009/136329 WO 20091112
- Main IPC: H03L5/00
- IPC: H03L5/00

Abstract:
The invention concerns in general measurement of the transfer function of linear time invariant systems, more particular the calibration of such systems based on a measured transfer function. According to a first aspect the present invention an arrangement for measuring the transfer function of a linear time-invariant system is disclosed. According to a second aspect of the present invention the arrangement is implemented into a linear time-invariant circuitry having a transfer function representing the amplitude and phase characteristic of the circuitry, where by means of the arrangement for measuring the transfer function the transfer function can be optimized in accordance with certain criteria on-the-fly, i.e. in or before operation of the circuit. Finally, an effective and simple method for measuring of the transfer function of a linear time-invariant system together with the use or application of the method is shown.
Public/Granted literature
- US20110043267A1 CALIBRATION OF LINEAR TIME-INVARIANT SYSTEM'S STEP RESPONSE Public/Granted day:2011-02-24
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