Invention Grant
- Patent Title: In-system margin measurement circuit
- Patent Title (中): 系统边际测量电路
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Application No.: US13721867Application Date: 2012-12-20
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Publication No.: US08686773B1Publication Date: 2014-04-01
- Inventor: Fulong Zhang , Chien Kuang Chen
- Applicant: Lattice Semiconductor Corporation
- Applicant Address: US OR Hillsboro
- Assignee: Lattice Semiconductor Corporation
- Current Assignee: Lattice Semiconductor Corporation
- Current Assignee Address: US OR Hillsboro
- Main IPC: H03K3/012
- IPC: H03K3/012

Abstract:
A margin circuit for controlling skew between first and second signals in order to determine margin, includes a variable delay circuit and a margin controller. Based on a current code value, the delay circuit applies a delay to the second signal to generate a delayed second signal. The margin controller generates the current code value for the variable delay circuit to be any one of a plurality of available code values. In one embodiment, the margin circuit is a write margin circuit that generates a first clock signal and a delayed second clock signal used to generate transmit (TX) clock and data signals having a non-zero phase offset between them. In another embodiment, the margin circuit is a read margin circuit that applies a phase offset between receive (RX) clock and data signals to enable the RX clock signal to be used to recover data from the RX data signal.
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